文件名称：Intel Rank Margin Test SOP_20181010.docx
文件大小：2.77MB
文件格式：DOCX
更新时间：2023-05-17 03:25:08
SI
Memory rank margin test is a memory test scheme under normal temperature and voltage. The whole test scheme is embedded in a specific BIOS. If the Rank Margin Tool option in BIOS is enabled, the platform will automatically enter Rank Margin test mode. The test results are output by serial port, it can detect the margin of the motherboard on the memory design part.