VLSI 电路设计验证与测试

【文件属性】：
文件名称：VLSI 电路设计验证与测试
文件大小：32.94MB
文件格式：PDF
更新时间：2014-10-20 23:11:23
VLSI Electronic Testing Agrawal Bushnell 正版购买电子资源，非扫描，Pdf文档目录详细可用。 ESSENTIALS OF ELECTRONIC TESTING FORDIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS. --Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.